Abstract
Cobalt alloy on chromium thin film media are used in industry because of their large values of coercivity (Hc), remanent magnetization (Mr), squareness (S*), and relatively low noise. The magnetic properties depend strongly on processing conditions and, as will be shown, the resulting microstructure.A complete structure-processing-properties analysis requires effective measurement of both magnetic and microstructural properties. Direct micromagnetic-microstructural comparison is not yet readily available, but bulk hysteresis loop parameters are reproducible and highly correlated with both desired recording characteristics and microstructures, and so provide a valuable, albeit indirect comparison. Signal to noise (S/N) measurements are also used as a more direct measure of usefulness in a high density disk drive. The nanoscale microstructural features which dramatically affect these bulk magnetic properties are difficult to observe. However, careful combination of TEM techniques, including bright-field, dark-field, high-resolution, selected area diffraction and elongated-probe microdiffraction can determine the subtle microstructural differences.
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