Abstract
A significant advance in the understanding of grain boundary contribution to magnetization in nanocrystalline ferrite thin films is demonstrated in this paper. RF-sputtered, room-temperature-deposited lithium–zinc ferrite thin films (Li 0.5− x /2Zn x Mn 0.1Fe 2.35− x /2O 4, with x=0.0, 0.16, 0.32 and 0.48) have been thermally annealed ex-situ at 850 °C and the in-plane magnetic measurements have been performed using a vibrating sample magnetometer. The percentage deviation between bulk and film magnetization ( δ M ) is observed to decrease with increasing Zn concentration, till x=0.32, and then it increases. Macro-texture measurements using X-ray orientation distribution function and micro-texture measurements using orientation imaging microscopy show reverse trend in the extent of crystallographic texturing and in the computed fraction of low-angle grain boundaries. This study brings out a correlation between low-angle grain boundary concentration and δ M .
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