Abstract
ABSTRACT Pb(Ti0.47,Zr0.53)O3 thin films have been investigated by atomic force microscopy, transmission electron microscopy and energy-dispersive X-ray analysis. The films were prepared by chemical solution deposition with 5–50 mol.% excess of PbO in initial solution on Si/SiO2/Ti/Pt substrates and annealed at 650°C × 20 min. Phase composition, grain and domain structures have been discussed and compared with electrical properties.
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