Abstract

Ethylene vinyl-acetate (EVA) encapsulated crystalline silicon PV modules see encapsulant related degradation such as the hydrolysis of EVA which leads to generation of acetic acid that corrodes cells and cell metallisation. The formation and discharge of acetic acid in PV modules during an extended damp-heat test are studied in this work in dependence of the EVA crosslinking degree. To achieve different degrees of EVA encapsulation, mini-modules were laminated under different curing temperatures. The thermogravimetric analysis (TGA) is used to estimate the vinyl acetate (VA) content of the EVA before and after damp-heat ageing, from which the formation of acetic acid is evaluated. The net accumulation of acetic acid within modules is evaluated by corrosion induced power losses. Results show mini-modules with highly cross-linked EVA form less acetic acid under damp-heat stresses, however, accumulated the highest amount of acetic acid leading to the most severe corrosion. Therefore, highly cross-linked EVA is not favoured in terms of long-term degradation due to DH stresses as it may trap the generated acetic acid within module

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