Abstract
The thermoelectric transport properties of artificially textured polycrystalline CrSiTe3 samples have been investigated for elucidating their correlations with a crystal structure and the corresponding charge density distribution. We verified that the low mobility of 13–27 cm2 V−1 s−1 attributing poor electronic transport properties is originated from the discrete charge density distribution in the covalently bonded layer. Also, the modulation of thermal conductivity values from 3.5 to 5.4 W m−1 K−1 with varying the texture was confirmed in pristine CrSiTe3. Thus, we suggest that the electronic and thermal transport properties of layer structured CrSiTe3 are strongly correlated with crystallographic features.
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