Abstract
The correlation between the crystallization of polyfluorene thin films and the surface free energy of several substrates has been investigated. To describe chemical properties of substrates, Owens' theory was employed, which divides the total surface free energy into (1) the dispersion force component and (2) the other component due to hydrogen bonding and dipole–dipole interactions. It is found that crystallization from glassy polyfluorene thin films by annealing is promoted on polyimide layers and octadecyltrichlorosilane monolayers, but is suppressed on quartz and hexamethyldisilazane monolayers. From the analysis of the surface free energy, it is concluded that the crystallization of polyfluorene thin films is strongly influenced not by the total surface free energy, but by the second component.
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