Correlation between structural and morphological properties of multilayer perovskite ZnTiO3coated porous silicon

Abstract

This work reports on correlation between structural and morphological properties of ZnTiO3/porous silicon (PS). The PS was elaborated by electrochemical anodization from the single- crystal p-type silicon wafer. Nanocrystalline ZnTiO3thinfilms have been prepared on PS using sol-gels pin coating technique. The deposited films were annealed in air at 800 °C for 2 h. The structural and morphological properties of the films were studied for different number of layers. X-ray diffraction spectra confirms that ZnTiO3films were hexagonal phase and the crystallite size of ZnTiO3films increased from 111 to 125 nm when the number of layers increase from 4 to 8 layers. SEM image shows approximate semi-spherical particles with a little agglomeration for all samples. The morphologies changed and the average grain size changed and increases from 81 nm to 131 nm.