Correlation between SEM and X-Ray Diffraction Imaging of Defect Structure in Single-Crystal Ni-Based Superalloy

Abstract

In the work the single-crystalline alloy CMSX-4 was studied. The main aim of the study was an attempt to find correlations between images of X-Ray topography, X-ray diffraction maps of lattice parameter and misorientation angle and Scanning Electron Microscopy (SEM) images obtained by back-scattered electron (BSE) technique. Topography images were obtained by Auleytner method with wide beam. Diffractometer provided by EFG company was used for obtaining orientation and lattice parameter maps. Material for research was produced in Research and Development Laboratory for Aerospace Materials of Rzeszów University of Technology. Casts were obtained in ALD furnace by the Bridgman technique. It was found that X-ray topograms were correlated with SEM images of microstructures as well as with orientation and lattice parameter maps. X-Ray topograms showed high contrast bands which corresponded to dendrite arms. There was a correlation between low angle boundary and lattice parameter map.