Abstract
We have carried out Raman and second harmonic generation (SHG) measurements to probe thermal poling-induced phenomena in glass 20Na2O-80[0.35Nb2O5-0.65GeO2]. A SHG response of 0.6 pm/V was measured after poling in a ∼3 μm thick layer under the anode and found to deviate from the widely used electric field-induced SHG model. This effect was associated with complex structural rearrangements in the subanode layer involving destruction of nonbridging oxygen atoms, formation of molecular oxygen, and enhancement of cross-linking in the glass network.
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