Abstract
AbstractFe/Ti multilayers (MLs) were prepared onto glass substrates at 295 K using UHV RF/DC magnetron sputtering. Planar growth of the Fe and Ti sublayers was confirmed in‐situ by X‐ray photoelectron spectroscopy (XPS). We have observed exponential variation of the XPS Fe‐2p and Ti‐2p integral intensities with increasing sublayer thicknesses. Systematic structural and magnetic studies showed, that iron sublayers grow on Ti in the soft magnetic nanocrystalline phase up to a critical thickness d crit ∼ 2.3 nm. For a thickness greater than d crit, the Fe sublayers undergo a structural transition to the polycrystalline phase with much higher coercivity. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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