Abstract
Creep tests of 2D-C/SiC in a wet oxidizing atmosphere were implemented for six samples. The loading process was monitored by acoustic emission (AE). Principal component analysis and a fuzzy clustering algorithm were used to perform pattern recognition of the AE data. All of the AE events were divided into four clusters and labelled as matrix cracking, interfacial damage, fiber breakage and fiber-bundle breakage respectively, according to their physical origin. It was found C/SiC has very scattered rupture lifetimes even under the same test conditions, and the evolution of AE events corresponding to fiber failure is quite different. With increasing rupture lifetime, the AE energy of fiber-bundle breakage is higher, while the number of these events is less. Thus, it is concluded that local oxidation and damage development is the controlling failure mechanism for short-lived specimens and uniform oxidation and damage development is the controlling failure mechanism for long-lived specimens.
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