Abstract
Visible/near-infrared reflectance spectra extracted from hyperspectral images of apples were used to determine wavelength pairs that can be used to distinguish defect regions from normal regions on the apple surface. The optimal wavelengths were selected based on correlation analysis between the wavelength band ratio (λ1/λ2) or difference (λ1 − λ2) and the assigned value for the surface condition (0 = normal, 1 = defect). Spectral images of apple surfaces at the selected wavelengths were used to validate the correlation analysis. The correlation coefficients obtained using the correlation analysis for band ratio and difference were 0.91 and 0.79, respectively. When applied to the set of apple images, the band ratio model correctly identified 195 of the 211 defects on a set of 70 Fuji apples containing at least one defect region. Thus, the correlation analysis was demonstrated to be a feasible method for selecting wavelength pairs for use in distinguishing defects from areas without defects on apples.
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