Abstract
Interference reflection microscopy (IRM) is a widely used technique to study cell adhesion and membrane topography on coverslips due to its easy implementation. It relies on the interference of two reflections, one from the coverslip-buffer interface and the second from the buffer-membrane interface, to produce interference patterns that depend on the distance of the membrane from the coverslip. Additional effects like multiple reflections from more membrane interfaces, tilt of the membrane surface in respect to the coverslip and higher order interference minima and maxima, however, make it hard to correctly interpret the resulting images [1].
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