Correction to "Electrode Doping and Dielectric Effect in Hole Injection into Organic Semiconductors through High Work-Function Oxides".

Abstract

ADVERTISEMENT RETURN TO ARTICLES ASAPPREVAddition/CorrectionNEXTORIGINAL ARTICLEThis notice is a correctionCorrection to “Electrode Doping and Dielectric Effect in Hole Injection into Organic Semiconductors through High Work-Function Oxides”Qi ShenQi ShenMore by Qi Shen, Xiaojuan SunXiaojuan SunMore by Xiaojuan Sun, and Song Chen*Song ChenMore by Song Chenhttps://orcid.org/0000-0001-8225-7560Cite this: J. Phys. Chem. Lett. 2023, 14, XXX, 5882Publication Date (Web):June 21, 2023Publication History Received11 June 2023Published online21 June 2023https://doi.org/10.1021/acs.jpclett.3c01605© 2023 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views-Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (720 KB) Get e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information Get e-Alerts