Abstract
[This corrects the article DOI: 10.3762/bjnano.4.40.].
Highlights
The following is a correction to the section “X-ray diffraction (XRD) of TiO2 and Ag-doped TiO2”, which contains a new Figure 1, an analysis of the data in the new Figure 1, and the raw data files used to create Figure 1
TiO2 nanoparticles annealed at 450 °C was calculated by the Scherrer equation to be approximately 20, 22, and 16 nm, respectively
As expected from previous works on similar Ag-doped TiO2 nanoparticles [1,2,3,4,5], the diffraction peaks associated with Ag were not observed
Summary
The following is a correction to the section “XRD of TiO2 and Ag-doped TiO2”, which contains a new Figure 1, an analysis of the data in the new Figure 1, and the raw data files used to create Figure 1 (included as Supporting Information File 1). The following is a correction to the section “XRD of TiO2 and Ag-doped TiO2”, which contains a new Figure 1, an analysis of the data, and the raw data files used to create Figure 1 (included as Supporting Information File 1). This issue was investigated further by the authors who were able to retrieve the correct raw data files associated with their materials.
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