Correction of experimental low-energy electron-diffraction intensities.

Abstract

For the determination of surface structure by quantitative low-energy electron-diffraction (LEED) analysis the experimental intensities are usually measured on the fluorescent screen of display-type optics and then routinely corrected for normalization to constant incident electron current and for background subtraction. An additional correction, which is not usually applied, corrects for the variation of the transparency of the grids in front of the fluorescent screen, as pointed out in 1974 by Legg, Prutton, and Kinniburgh. We show that this correction can be rather easily implemented on data collected with modern computer-controlled data-acquisition systems. The correction is carried out, as an example, on LEED intensity data from Al{110}.