Abstract
A method has been developed for determining the dead time of electron-probe detector circuits, which used the relative intensities of two diffraction lines corresponding to the same characteristic x-ray for a pure metal and one of its alloys. It is particularly adapted to single-detector probes with specimen and detector in a common vacuum chamber, and where most other techniques cannot be used. Dead times of 1.3×10−6 sec and 12×10−6 sec were obtained for CuKα radiation in two Philips gas-flow proportional counters using this method. These results were in excellent agreement with those obtained by using the multiple-foil technique.
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