Correction factors for low perturbation in vivo diodes used in the determination of entrance doses in high energy photon beams

Abstract

Low perturbation diodes, with thin buildup caps, can be used to reduce perturbations to the delivered dose. The literature states that additional correction factors are required for low perturbation diodes, however, there are few reported studies into their use. This report measured the dose perturbations and correction factors for diodes with varying buildup cap thicknesses. Scanditronix EDP15, EDD5, and EDD2 diodes were investigated. Dose perturbations and correction factors for field size, source-surface distance (SSD), obliquity, and wedge were measured in megavoltage photon beams. EDP15 produces a 6% dose perturbation. EDD5 produces a perturbation between 1% and 2%. EDD2 perturbation is negligible. The variation of correction factors for the full buildup EDP15 diode is small and consistent with the literature. The low perturbation diode EDD2 has large correction factors. The field size correction factor varies from 1.38 to 0.87 for 10 MV. The SSD correction factor varies from 0.92 to 1.09 for 10 MV. At the maximum angle measured, the obliquity correction factor is 0.73 for 10 MV. Intermediate results were observed for the EDD5 diode. It is expected that it will be very difficult to achieve accurate in vivo dosimetry using the EDD2 diode. The EDD5 diode may represent a reasonable compromise between EDD2 and the full buildup EDP15. The EDD5 dose perturbation is small and the correction factors are not as large as for EDD2, so accurate in vivo dosimetry may be possible as long as the obliquity is below 45 degrees.