Abstract
Correction for 'Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering' by Dong-Jin Yun et al., Phys. Chem. Chem. Phys., 2018, 20, 615-622.
Highlights
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering
The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers
E-mail: Minsu.seol@samsung.com e Energy Materials Center, Energy & Environment Division, Korea Institute of Ceramic Engineering & Technology, 101 Soho-ro, Jinju-si, Gyeongsangnam-do 52851, Republic of Korea
Summary
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering.
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