Correcting leaf area measurement by conventional methods: a new approach for apple(Malus domesticaBorkh)

Abstract

Conventional techniques for leaf area measurement, although non-destructive and capable of handling large samples, often produce values widely different from true leaf areas. Parameter values estimated by conventional methods can be corrected with a high degree of accuracy by using correction factors. The present investigation evaluates the significance of factors derived for two common conventional methods and ten apple cultivars. The studies were carried out between 1983 and 1989 at three locations in District Tehri Garhawl, India, on mature fruiting trees of ten commercial apple cultivars. Leaf samples were selected randomly and leaf areas determined by eight methods. The estimated parameter values were assessed statistically and compared with the true leaf area, as measured by planimeter, to test their reliability. The estimated leaf area corrected by derived constant factors in two conventional methods (leaf area determination by L x W and fresh weight) showed a high degree of accuracy and both const...