Abstract

In this paper, the electret properties of negative and positive charging at room and elevated temperatures for polychlorotrifluorothylene (Aclar PCTFE) were studied by means of corona charging, electron beam bombardment, and thermally stimulated discharge (TSD). The shift of mean charge depth with the prolongation of time during aging at 150 degree(s)C after corona charging at RT was investigated. The transport model of detrapped charge in an Aclar PCTFE sample was discussed by means of laser induced pressure pulse (LIPP) method. The geometric distribution of traps with different activation energies along thickness was studied by means of electron beam discharge and TSD currents in combination with heat pulse method. At the same time, the comparison of the charge storage ability between positive and negative corona charged sample was carried out.

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