Abstract
The authors propose a core loss calculation method for power electronics converter excitation from sinusoidal excited core loss data. This method is based on Brockmeyer’s theory and adapts to calculate core loss under DC-bias excitation conditions. Furthermore, the number of core loss test conditions are reduced as this method only requires the addition of DC-bias characteristics to the sinusoidal excitation core loss data provided by the core manufacturers. To validate the proposed method, the core losses under sinusoidal and square voltage excitations are first measured by a BH analyzer with a DC-bias excitation unit. Then, the measured values under a square voltage excitation and the calculated values from a sinusoidal excited core loss data are compared.
Highlights
Advances in wide band gap power semiconductor devices such as silicon carbide (SiC) and gallium nitride (GaN) devices have significantly enhanced the power density of power electronic converters
The reduced surface area of these magnetic devices leads to increased thermal resistance and temperature stresses
In Ref. 2, the energy loss resulting from the magnetic devices in power electronics converters was determined to be higher than that from the semiconductor device
Summary
Advances in wide band gap power semiconductor devices such as silicon carbide (SiC) and gallium nitride (GaN) devices have significantly enhanced the power density of power electronic converters. The datasheet for the core loss that is provided by magnetic core manufacturers expresses sinusoidal voltage-excited core loss data. In the excitation of power electronics converters, the core loses are generated via square voltage excitations and the DC-bias condition. One solution to account for this difference involves the use of a square voltage wave that is approximated from the sinusoidal voltage wave, but the accuracy of this method is affected when the excitation waveform has DC-bias components. Another solution uses the square voltage and DCbias excited core loss data.. The authors propose a core loss calculation method for the excitation of power electronics converter, using the sinusoidal excited core loss data.
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