Abstract

Rutherford backscattering and optical absorption measurements were used to characterize both intrinsic and extrinsic defects produced in MgO single crystals by implantation with 250 keV Cu 2+ ions at a fluence of 1 × 10 17 ions/cm 2. Several absorption bands identical to those found in neutron irradiated crystals were observed and have been previously associated with oxygen vacancies and higher-order defects involving oxygen vacancies. In addition, a broad extinction band centered at ≈3.0 eV is observed and is attributed to copper precipitates. The maximum concentration of the implanted Cu ions occurs at a penetration depth of ≈130 nm. The copper colloids start to dissolve at temperatures above 1100 K and by 1500 K most of the copper ions have diffused into substitutional sites. Hardening induced by implantation was characterized by nanoindentation measurements.

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