Abstract

The quaternary alloy of Cu2CdSnS4 (CCSS) is one type of thin film materials that contributes to the field of photovoltaic devices manufacturing, the importance of which has not been commonly enlightened as most of the other materials. For the preparation of CCSS thin films at 350 °C on glass substrates, the chemical spray pyrolysis technique was used. The optical properties of thin films prepared under the influence of the variation of copper solution molarity (0.03, 0.05, 0.07, and 0.09 M) on the quaternary compound were examined using a UV-vis spectrophotometer. The findings of the AFM study showed the atoms on the surface that are acclimatized in the form of nanorods with an increase in the average grain size from 62.72 to 79.17 nm. The results also showed an improvement in the average surface roughness from 5.69 to 12.8 nm when copper concentration increased from 0.03 to 0.09 M. The UV-vis results showed that the optical transmittance of CCSS decreases by increasing the solution molarity of copper, with a change in the absorption edge toward the low energy side (redshift). With an increase in the wavelength between 725 and 960 nm, a low absorption coefficient was found in the infrared region, while a strong absorption coefficient in the visible range was observed with the increase in copper solution molarity. The energy gap values decreased from 1.6 to 1.47 eV when copper solution molarity increased from 0.03 to 0.09 M. By raising copper solution molarity to 0.09 M, the refractive index at the absorption edge was increased from 1.6 to 1.97, while the extinction coefficient reduced.

Highlights

  • The chemical and physical properties of semiconductor materials have been improved with technological advances in semiconductors

  • Figure-1 demonstrates the topography of thin CCSS films at room temperature with various concentrations of copper

  • The sharpness and number of hills on the surface increased with increasing copper concentration, accompanied by enhancement of the columnar structure, as revealed by the 3D micrographs

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Summary

Introduction

The chemical and physical properties of semiconductor materials have been improved with technological advances in semiconductors. Materials were built from more powerful and cost-effective semi-conductive thin films with both the advent of nanotechnology and polymer science in the last decades [1]. Studying the deposited materials in the form of thin film is one of the most important ways to further define many chemical and physical properties of one or more layers of material atoms with a thickness not exceeding one micron [2]. In the last two decades, applications such as protection, decoration, and manufacturing of optical-electronic devices were the main industrial developments produced by thin films. Studies on the physical characteristics of thin films, such as optical properties, have been of growing interest due to a wide variety of applications in the industry [3]. Chemical spray pyrolysis (CSP) is widely used to prepare thin and thick films, semiconductor metal oxides, ceramic coatings, which is a simple and cost-effective technique. In the field of optics, thin films are used in the profession of imaging and duplicating devices, in addition to the production of optical filters, which in turn includes the design of mirrors, anti-reflective mirrors, and edge filters [7]

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