Abstract
Copper and aluminum electric corrosion is investigated experimentally. It is founded that copper corrosion is higher than aluminum corrosion. Intermetallics disappearance rate in Cu-Al system is analyzing theoretically. Literature experimental data are used for analysis.
Highlights
Mutual diffusion in β-phase (CAl ≈ 0.24 ± 0.02) of Cu-Al system was investigated at temperatures from 700 oC to 840 oC (β-phase can exist at temperatures that are higher than 565 oC) [1]
The phase formation kinetics between α-phase (CAl ≈ 0.15) and γ-phase (CAl ≈ 0.31) was analyzed, and β-phase formation kinetics between pure copper (99.99 % Cu) and γ-phase (CAl ≈ 0.31) was analyzed too
It was proved experimentally that mutual diffusion penetrability of β-phase does not depend on annealing time and initial composition
Summary
Mutual diffusion in β-phase (CAl ≈ 0.24 ± 0.02) of Cu-Al system was investigated at temperatures from 700 oC to 840 oC (β-phase can exist at temperatures that are higher than 565 oC) [1]. It was proved experimentally that mutual diffusion penetrability of β-phase does not depend on annealing time and initial composition. It was proved experimentally [2] that copper corrosion rate is higher than gold corrosion rate, but intermetallics formation rate in Au-Al system is much more higher than intermetallics formation rate in Cu-Al system, so it is possible to use Cu instead of Au for wire bonding in microelectronics packaging, because thin Al pad (1.2 μm thickness) can prevent gold and copper corrosion, and Cu has higher electric conductivity, higher thermal conduction, and lower material cost than Au. Theoretical method was proposed to describe intermetallics disappearance rate in double multiphase systems [3]. Direct current can dissolve metal anode into electrolyte, and we planned to do experiments under the same conditions: initial radii of Al and Cu anodes should be equal; electrolyte concentration should be the same; anodes lengths immersed into electrolyte should be approximately equal; graphite cathodes should be the same; direct electric current value should be practically the same
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