Abstract
Amorphous films in the system MgOSiO 2 were prepared by rf-sputtering and their density and refractive index were measured. The glass forming region was greatly enlarged and amorphous films containing 0–60 mol% MgO were obtained. The density and refractive index increased linearly with increasing MgO content. The coordination state of magnesium ions in these amorphous films was also examined by measuring the change in molar refractivity and the chemical shift of the magnesium Kα band X-ray emission spectra. Most of the magnesium ions in the amorphous films were found to be in the tetrahedrally coordinate state. This conclusion was supported by the color of the rf-sputtered amorphous films containing Co 2+ ions introduced wholly or partially in place of Mg 2+ ions.
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