Conversion of the CERN PS Booster Controls: Local Hardware Test and Accelerator Study Facilities

G Baribaud,G Suberlucq,M Chanel,F Perriollat,C Carter,J P Royer,P Burla,P Heymans,B Schonauer,J Donnat

doi:10.1109/tns.1981.4331652

G Baribaud, G Suberlucq + Show 8 more

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https://doi.org/10.1109/tns.1981.4331652

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Abstract

The CERN PS Booster (PSB) has been connected to the new computer control system (NORD-CAMAC) during the four months' shutdown in summer and autumn 1980. Subsequently the PSB had to furnish beams of high quality, particularly for the Antiproton Accumulator (AA). To make the change-over efficient and possible within the time and manpower limitations, local autonomous microcomputer-aided test facilities were used for more than a year. These were designed (i) for the development of process equipment including its electronics, (ii) for equipment commissioning, (iii) for fault diagnosis and (iv) for the improvement of the future machine performances. The specifications, the detailed implementation and the results are reported.

Highlights

Much of the equipment of the CPS accelerator complex was connected to a computer control system in the late sixties
This computer system was built from an IBM 1800 computer', a CERN-designed digital data transmission system (STAR) and three IMLAC PDSl minicomputers used either as central control consoles in the Main Control Room (MCR) or as a slave local console in PS-Booster (PSB) equipment rooms'
Our cumulative maintenance and machine experiments procedures based on a local means of interaction showed that it was necessary to implement more specialized mobile computer facilities near to the equipment to be controlled or serviced, The new local test facilities proved to be indispensable both during the preparation and the carrying out of the controls conversion

Summary

The CERNPS Booster (PSB) has been connected to the new computer control system (NORD-CAMAC)during the four months' shutdown in summer and autumn 1980. The PSB had to furnish beams of high quality, for the Antiproton Accumulator (AA). To make the change-over efficient and possible within the time and manpower limitations, local autonomous microcomputer-aided test facilities were used for more than a year. These were designed (i) for the development of process equipment including its electronics,. (ii) for equipment commissioning, (iii) for fault diagnosis and (iv) for the improvement of the future machine performances. The specifications, the detailed implementation and the results are reported

Introduction

Conclusion