Abstract
Two-dimensional (2D) 2H-1 T′ heterojunctions based on transition-metal dichalcogenides have attracted great attention due to their special interface structures and novel properties. Understanding the growth mechanism and the interface structures is essential for their controllable growth. In this work, we successfully synthesize lateral and vertical MoS2/ReS2 heterojunctions by using a two-step chemical vapor deposition (CVD) method, and deeply explore the evolution of the structure. It is found that the growth mode of heterojunction undergoes a transition from lateral epitaxy to vertical stacking under a high Re/S ratio during the growth. Furthermore, the interface structure is greatly determined by the edge shape of MoS2 core. Two kinds of structures, with the b-axis of 1 T′ ReS2 shell parallel to the (100) and (010) plane of MoS2 core respectively, are observed. Meanwhile, by comparing with MoS2 monolayer, MoS2/ReS2 heterostructures possess a reduced emission intensity due to the carrier transfer. This work provides a robust and controllable strategy for the synthesis of heterostructures with different phase structures.
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