Abstract

Femtosecond four-wave mixing experiments on low-temperature-grown (LT-) GaAs for a range of post-growth annealing temperatures indicate that the Urbach band tail abruptly diminishes above 550°C due to the conversion of As-related point defects to As clusters and that the interband dephasing time is limited by scattering with As point defects for annealing temperatures below 550°C. In addition, we observe a complex interplay of polarization source terms associated with the exciton and Urbach band tail for annealing temperatures below 550°C. These experiments shed light on the carrier dynamics and ultrafast nonlinear optical properties of LT-GaAs.

Highlights

  • Control of the Urbach band tail and interband dephasing time with postgrowth annealing in low-temperaturegrown GaAs

  • The unique characteristics of this material that make it attractive for such applications stem from the incorporation of up to 0.6% excess arsenic during growth.[16]. This excess arsenic leads to a high density of Asi and AsGa point defects and associated midgap states[11,16] as well as local potential fluctuations that lead to spatially localized states below the band gap.[17]

  • Our experiments show that four-wave mixing (FWM) spectroscopy provides a sensitive probe of the defect distribution in low-temperature-grown semiconductors, providing an avenue for tailoring these defects for applications such as saturable absorbers and THz switching devices

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Summary

Introduction

Control of the Urbach band tail and interband dephasing time with postgrowth annealing in low-temperaturegrown GaAs. This feature is highlighted, which shows the FWM spectrum from the as-grown LT-GaAs sample, alongside the response from HT-GaAs. An abrupt change in the signal characteristics occurs at an annealing temperature of 550◦C: The interband continuum response grows substantially relative to the exciton signal, and the band tail contribution is strongly reduced.

Results
Conclusion
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