Control of the higher eigenmodes of a microcantilever: Applications in atomic force microscopy

Abstract

While conventional techniques in dynamic mode atomic force microscopy typically involve the excitation of the first flexural mode of a microcantilever, situations arise where the excitation of higher modes may result in image artefacts. Strong nonlinear coupling between the cantilever modes in liquid environments may result in image artefacts, limiting the accuracy of the image. Similar observations have been made in high-speed contact mode AFM. To address this issue, we propose the application of the modulated-demodulated control technique to attenuate problematic modes to eliminate the image artefacts. The modulated-demodulated control technique is a high-bandwidth technique, which is well suited to the control of next generation of high-speed cantilevers. In addition to potential improvements in image quality, a high-bandwidth controller may also find application in multifrequency AFM experiments. To demonstrate the high-bandwidth nature of the control technique, we construct an amplitude modulation AFM experiment in air utilizing low amplitude setpoints, which ensures that harmonic generation and nonlinear coupling of the modes result in image artefacts. We then utilize feedback control to highlight the improvement in image quality. Such a control technique appears extremely promising in high-speed atomic force microscopy and is likely to have direct application in AFM in liquids.