Control of industrial products by microfocus radiography

Abstract

X-ray methods in comparison with other control methods are characterized by high information content, clarity and efficiency. The paper presents the results of the use of microfbcus radiography in the control and diagnostics of industrial products. A distinctive feature of the microfbcus radiography method is the use of an X-ray source with a focal spot of micron sizes and a survey geometry with a direct geometric increase in the object of study. The minimum dimensions of the rendered structures in this case are not limited by the pixel size of the image receiver and can be significantly smaller. It is shown that the use of the microfbcus radiography method makes it possible to increase the information content of the resulting radiographs by at least an order of magnitude, due to an increase in spatial resolution. At the same time, the technical means for implementing the described method can be small-sized, designed for use in non-stationary and non-specialized conditions. The results obtained can be used in scientific research and industrial control in the following areas: electronics, additive technologies, instrumentation and others.