Abstract
Abstract Statistical process control (SPC) charts play a very important role in the determination of process capability. It is important that SPC be achieved via the use of appropriate control charts before process capability indices are calculated, so that the indices reflect the long‐term capability of a process to produce product within specification. A significant portion of the theoretical research dedicated to process capability indices has focused on those index estimators that utilize a pooled estimator of process variance, but data collected in subsamples from an in‐control SPC chart, most likely an X − R or X − s chart, is preferred in practice for index estimation to insure process stability. This article is focused on the significant work published to date on process capability indices estimated using subsamples, including confidence bounds and hypothesis testing procedures for the primary indices C p , C pk , and C pm .
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