Abstract
A chemometric method is described for the determination of the relative importance of four variable experimental parameters (refractive index > angle of incidence > aperture ≫ time) for a given wavenumber v = 1600cm−1 and a sample thickness d ≈ 1 μm to the observed incompensations at FTIR-ATR-absorbance subtract measurements in a practical case (polystyrene). The method is based on an experimental design using simultaneous variation of all parameters rather than a single-at-a-time-approach. To minimize incompensations (spurious bands) it was found necessary to keep all parameters constant for the spectra to be subtracted or to use extremely low layer thickness (d ≈ 0.1 μm), requirements which are met during in situ analysis experiments at solid-liquid interfaces.
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