Abstract
X-ray absorption spectroscopy is a powerful tool to study in situ the behavior of materials under high pressure. It provides structural information on the local environment of a given atom and its modifications under the action of pressure: bond length variation, coordination change, amorphization etc... The site specific data obtained from both XANES and EXAFS analysis are reported in comparison with other techniques (X-ray or neutron diffraction in particular) for examples from semiconductors, molecular solids, GeO2 glass. The future developments of high pressure XAFS related to the new generation of synchrotron radiation sources are discussed.
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