Abstract
This paper reports the application of a new optical technique for revealing etched charged-particle tracks in muscovite mica. The technique utilises the light trapping properties of mica, and can reveal etched tracks at a stage when they are too small for identification by conventional optical illumination modes. A degree of contrast is produced which is unobtainable by any other technique. All the background and unwanted features are rendered black, while the tracks appear as bright features.
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