Abstract
Access to subtle ultrafast effects of light-matter interaction often requires highly sensitive field detection schemes. Electro-optic sampling, being an exemplary technique in this regard, lacks high sensitivity in an imaging geometry. We demonstrate a straightforward method to significantly improve the contrast of electric field images in spatially resolved electro-optic sampling. A thin-film polarizer is shown to be an effective tool in enhancing the sensitivity of the electro-optic imaging system, enabling an adjustment of the spectral response. We show a further increase of the signal-to-noise ratio through the direct control of the carrier envelope phase of the imaged field.
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