Continuous wave terahertz phase imaging with three-step phase-shifting

Abstract

We demonstrated a continuous wave terahertz (THz) phase imaging system which can present the depth information of an object's surface interior accurately and non-invasively. With the three-step phase-shifting method, the phase images of samples which can provide the relative optical depth profile of the sample's surface and interior have been achieved. Two samples with different thickness and materials were measured to demonstrate the phase imaging ability of the system. The results show that this method is effective and the measured values agree well with the actual ones. The longitudinal resolution of the system was also measured. To exhibit the advantages of the three-step phase shifting method, the multi-wavelength imaging method was also employed and the results are compared.