Abstract
We present a new approach to simulate Beyond-Standard-Model (BSM) processes which are defined by multiple parameters. In contrast to the traditional grid-scan method where a large number of events are simulated at each point of a sparse grid in the parameter space, this new approach simulates only a few events at each of a selected number of points distributed randomly over the whole parameter space. In subsequent analysis, we rely on the fitting by the Bayesian Neural Network (BNN) technique to obtain accurate estimation of the acceptance distribution. With this new approach, the signal yield can be estimated continuously, while the required number of simulation events is greatly reduced.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.