Continuous index of refraction measurements to 20 GPa in Z-cut sapphire

Abstract

Isentropic compression experiments (ICE) on Sandia National Laboratories’ Z Accelerator are used to make continuous measurements of the index of refraction in single crystal Z-cut sapphire as the longitudinal stress is gradually increased to 20 GPa (uniaxial strain of about ∼3.9%). A planar, ramp compression wave, generated by a large magnetic field, propagates through a planar copper base plate. Part of the rear surface of the base plate is a free surface and part is covered with a sapphire window. Comparisons are made of velocity histories measured simultaneously at the free surface and at the copper/sapphire interface using a velocity interferometer system for any reflector (VISAR). This is sufficient to determine the index of refraction of the sapphire continuously as a function of density. Perturbations to the compression waves caused by interactions with the free surface and with the sapphire are accounted for by backward or forward solutions to the equations of motion. The effect of the unsteady nature of the compression wave in sapphire on the interferometry measurements is also taken into account. Results validate the interpretation of VISAR measurements on continuous loading experiments performed with optical windows. The measured index of refraction of sapphire agrees with previous studies validating this experimental technique and showing that it is useful for studying other materials for which index of refraction data do not exist. In addition, measured compression isentropes for copper and sapphire compare favorably with existing theoretical models.