Abstract
In this article, a new technique, continuous energy diffraction spectroscopy (CEDS) is described, for diffraction experiments using a synchrotron energy dispersive polychromatic beamline. This type of beamline uses a curved crystal monochromator (polychromator) to focus a range of x-ray energies (bandwidth ∼1 keV) into a narrow (100–120 μm) line image. With a sample at this image point, using an 2D detector, we are able to measure diffracted intensities for the entire energy range of the incident beam simultaneously with limited or no motion of the sample. This method allows the collection of anomalous scattering and diffraction anomalous fine structure (DAFS) data faster and more accurately than with conventional methods. Because of the speed with which these types of diffraction experiments can be done, this method creates new options for time resolved diffraction experiments and provides new data collection strategies.
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