Abstract
A reel-to-reel PLD system was set up for studying YBCO coated conductor. YBCO films could be continuously grown on the CeO2/YSZ/Y2O3 buffered Ni-5W tape. Some deposition parameters were investigated. XRD θ–2θ scans were employed to characterize the c-axis orientation and in-plane texture of YBCO films deposited with different laser repetition rates and tape moving speeds. We investigated the dependence of critical current Ic on laser repetition rates and tape moving speeds for YBCO films. It had been found that a-axis oriented grains appeared as YBCO layer thickness increased, which prevented the values of Ic improved.
Published Version
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