Contemporary Extensions of the Rasch Model

Abstract

This paper will introduce, discuss and illustrate two contemporary extensions of theRasch model: the one parameter logistic model (Verhelst and Glas, 1995) and theMultidimensional Rasch model (Hoijtink et al., 1999). Using data with respect tothe measurement of schizotypy (Vollema and Hoijtink, 2000) the most importantfeatures of both models will be illustrated. For the one parameter logistic modelthese include: a (discrete) discrimination parameter for each item; a test for itembias; and, estimation of the location of a person on the (latent) trait that is beingmeasured. For the multidimensional Rasch model these include: specification ofthe model; and, model selection. All analyses presented in this paper can be executedusing either OPLM (Verhelst et al., 1995), TESTFACT (Wilson et al.,1984) or ConQuest (Wu et al., 1998). At the end of the paper some features ofmodels and software that have not been discussed will be summarized.