Abstract
A combination and modification of recently proposed techniques for contactless resistivity measurements were found to be well suited for the investigation of flat samples much smaller (surface area >or=0.5 mm2) than reported so far. The described experimental set-up is applicable for samples with sigma t>or approximately=1 Omega -1 ( sigma is the conductivity, t the thickness of the sample) and thus covers a conductivity regime complementary to the microwave cavity perturbation method.
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