Abstract
We introduce a systematic study of contact structures with pseudo-Riemannian associated metrics, emphasizing analogies and differences with respect to the Riemannian case. In particular, we classify contact pseudo-metric manifolds of constant sectional curvature, three-dimensional locally symmetric contact pseudo-metric manifolds and three-dimensional homogeneous contact Lorentzian manifolds.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
