Abstract
A contact-less characterization technique is indispensable for the development and the application of long coated conductors. The Hall sensor array technique is a very sufficient one for high-speed measurements of the critical current density distribution along the length of coated conductor tapes. Careful analysis showed that the critical current induced in this technique corresponded to a rather low voltage criterion in comparison with the usual value, 1 muV/cm . Therefore, it is necessary to estimate the n-value in addition to the J <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">c</sub> value to fully characterize tapes. We have already developed a contact-less technique for the measurement of n-value of thin films. We apply this technique to coated conductors.
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