Construction of refractive‐index profiles of graded‐index planar waveguides from effective indexes measured with different mode types and external refractive indexes

Abstract

AbstractA method is presented whereby the refractive‐index profile (RIP) can be reconstructed from sets of effective indexes measured with different mode types and external refractive indexes. Single‐mode waveguide RIP characterization can be easily realized using an index‐matching liquid at a single wavelength. This method is described and demonstrated via numerical examples and experimental results. The method has the advantages of convenient operation and accurate results for the characterization of graded‐index planar waveguides that support both mode types and contain known modal birefringence. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 45: 342–345, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20818