Abstract

Ensuring product quality is crucial for enhancing a company's competitiveness, and product lifetime serves as a vital metric, particularly in the context of electronic goods, for evaluating product quality. To meet quality requirements and mitigate risks for both producers and consumers, thorough examinations of components and final products are necessary. Acceptance sampling plans are commonly employed to achieve these objectives. When assessing product lifetime under non-normal distributions, the lifetime performance index emerges as a valuable and frequently utilized metric. In practical scenarios, lifetime tests may encounter challenges such as the absence of experimenters to observe all product lifetimes and the possibility of accidental product breakage. To address these issues, this study introduces two sampling schemes: a single sampling plan and a repetitive group sampling plan. These plans are specifically designed for exponential lifetime products, utilizing the progressively type II right censored sample as the data type for lifetime testing. The study provides tabulated plan parameters for practical implementation and presents a comparative analysis between the two proposed plans. Furthermore, a practical example is presented to demonstrate the efficacy of the developed sampling plans.

Full Text
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