Abstract
Precise measurements of the temperature dependence of additional resistivity caused by defect scattering were used to constrain models of carrier transport in La1.84Sr0.16CuO4. Where previous magnetotransport studies have delineated two distinct scattering processes, proportional to T and T 2, respectively, the new defect scattering results suggest strongly that the two processes act as parallel conductance channels.
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Schedule a callMore From: Journal of Superconductivity: Incorporating Novel Magnetism
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