Abstract
The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED display lifetime assessment using violet light-induced accelerated aging. Maximum likelihood estimations using lognormal distributions are performed based on datasets acquired from samples exposed to six different degrees of violet irradiance and accelerated life model is shown to accurately fit experimental data using an inverse power law. Based on these results, weighted average of the logarithmic standard deviation, the average life and median life can then be obtained for specific conditions of operation of the devices. As this method relies exclusively on violet light-induced degradation at room-temperature, this minimally-invasive testing procedure requires no significant modification to the display hardware architecture.
Highlights
The organic light emitting diode (OLED) technology made reliable progress from its first viable prototypes in the late 1980’s [1]
We show that maximum likelihood estimation using lognormal statistics on data acquired from displays exposed to six (6) different violet irradiances can yield accurate accelerated-lifetime equations using a simple inverse power-law model
The Commercial passive matrix OLED (PMOLED) Displays While UV-induced accelerated aging methods have been previously proposed [8], the main objective of this study is to demonstrate its potential to allow accurate lifetime prediction for commercial OLED displays
Summary
The organic light emitting diode (OLED) technology made reliable progress from its first viable prototypes in the late 1980’s [1]. (2016) Constant-Stress Accelerated Degradation Life Test of an Organic Light-Emitting Diode Display under Violet Light. Most of the measurement techniques suggested involve direct current measurement across the junction [4]-[7] These methods require important hardware modifications and still require several hundreds of hours of testing. A new approach using ultra-violet (UV) light as a degradation agent was proposed as an efficient alternative mechanism for accelerated aging of OLEDs [8]. As such, this method requires no significant hardware modification prior to testing
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