Abstract
A constant-current contour plot in the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V_{ds}-V_{gs}</tex> plane is proposed as a means of describing short-channel behavior of MOS transistors. Characteristics of the constant-current contour plot are presented and related to short-channel behavior. As an example, short-channel behavior of a typical NMOS technology is described utilizing constant-current contour plots that are generated from the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I-V</tex> data obtained by two-dimensional device simulation.
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